Free access article
A&A 390, 1171-1176 (2002)
DOI: 10.1051/0004-6361:20020404
Integrated optics for astronomical interferometry
V. Extension to the
band
E. Laurent1, 2, 3, K. Rousselet-Perraut1, P. Benech2, J. P. Berger4, 1, S. Gluck5, P. Haguenauer1, P. Kern1, F. Malbet1 and I. Schanen-Duport2
1 Laboratoire d'Astrophysique de l'Observatoire de Grenoble, BP 53, 38041 Grenoble Cedex 9, France
2 Institut de Microélectronique, Electromagnétisme et Photonique, BP 257, 38016 Grenoble Cedex 1, France
3 Alcatel Space Industries, BP 99, 06156 Cannes La Bocca Cedex, France
4 Harvard-Smithsonian Center for Astrophysics, 60 Garden Street, Cambridge, MA 02138, USA
5 Laboratoire d'Electronique, de Technologie et de l'Information, 17 rue des Martyrs 38054 Grenoble Cedex 9, France
(Received 20 December 2001 / Accepted 14 March 2002)
Abstract
We report laboratory and on sky characterizations of planar
integrated optics beam combiners in the
K ([ 2.0
m; 2.4
m] )
and
K' ([ 2.02
m; 2.30
m] ) bands. Because of the strong scientific
interests of the
K band, we have extended the integrated
optics technologies available in the telecom range (i.e. at 0.8
m,
1.3
m and 1.5
m) to 2.0-2.5
m.
Ion exchange components optimized for these atmospheric bands provide stable
contrasts higher than 95% with a laboratory white-light source
and global throughputs of 35% in this spectral range.
These results are completed with first stellar interferograms obtained
with a silica-on-silicon two-way beam combiner on the IOTA interferometer.
We characterized in the
H and
K bands the throughput of this beam
combiner optimized for the
H band ([ 1.47
m; 1.78
m] ).
On-sky fringes obtained on
Aur in the
H and
K' bands clearly
demonstrate a high instrumental contrast (larger than 50%) in both bands.
This shows that integrated optics works with high performance
outside its usual wavelength domain and provides good solutions for
astronomical interferometry in a large wavelength range.
We have measured single-mode ranges over 1
m on our components which
would allow to observe in two spectral bands simultaneously
or to integrate both metrology reference and science signals in a single
chip for astrometric applications.
Key words: techniques: interferometric
Offprint request: E. Laurent, Emmanuel.Laurent@obs.ujf-grenoble.fr
© ESO 2002



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